Probing Access Resistance of Solid-State Nanopores with a Scanning-Probe Microscope Tip
نویسندگان
چکیده
منابع مشابه
Probing access resistance of solid-state nanopores with a scanning-probe microscope tip.
An apparatus that integrates solid-state nanopore ionic current measurement with a scanning-probe microscope is developed. When a micrometer-scale scanning-probe tip is near a voltage-biased nanometer-scale pore (10–100 nm), the tip partially blocks the flow of ions to the pore and increases the pore access resistance. The apparatus records the current blockage caused by the probe tip and the l...
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متن کامل
Studying of various nanolithography methods by using Scanning Probe Microscope
The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. In this paper, a qualified overview of diverse lithog...
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ژورنال
عنوان ژورنال: Small
سال: 2011
ISSN: 1613-6810
DOI: 10.1002/smll.201101337